DocumentCode :
1286476
Title :
Doping, Tunnel Barriers, and Cold Carriers in InAs and InSb Nanowire Tunnel Transistors
Author :
Sylvia, Somaia Sarwat ; Khayer, M. Abul ; Alam, Khairul ; Lake, Roger K.
Author_Institution :
Dept. of Electr. Eng., Univ. of California, Riverside, CA, USA
Volume :
59
Issue :
11
fYear :
2012
Firstpage :
2996
Lastpage :
3001
Abstract :
InAs and InSb nanowire tunnel field-effect transistors require highly degenerate source doping to support the high electric fields in the tunnel region. For a target on-current of 1 μA, the source Fermi energy lies in the range of 0.1-0.22 eV below the valence band edge depending on the material and diameter. Despite the large degeneracy, the devices achieve minimum inverse subthreshold slopes of ~ 30 mV/dec. In the subthreshold, these devices experience both regimes of “voltage-controlled tunneling” and “cold-carrier injection.” The reduction of the inverse subthreshold slope from each of these two processes is quantified. Numerical results based on a discretized eight-band k-p model are compared to analytical WKB theory. The standard WKB theory gives good qualitative agreement with the full-band numerical simulations.
Keywords :
Fermi level; field effect transistors; indium compounds; nanowires; semiconductor doping; tunnel transistors; tunnelling; InAs; InAs nanowire tunnel FET; InSb; InSb nanowire tunnel FET; cold-carrier injection; current 1 muA; discretized eight-band k-p model; doping; electron volt energy 0.1 eV to 0.22 eV; field-effect transistors; source Fermi energy; tunnel barriers; voltage-controlled tunneling; Doping; Logic gates; Photonic band gap; Quantum capacitance; Standards; Transistors; Tunneling; Cold-carrier injection; InAs nanowire (NW); InSb NW; inverse subthreshold slope; tunnel field-effect transistor (TFET); voltage-controlled tunneling;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2212442
Filename :
6304912
Link To Document :
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