DocumentCode
1286639
Title
Advanced Microwave Imaging
Author
Ahmed, S. Shahnawaz ; Schiessl, A. ; Gumbmann, F. ; Tiebout, Marc ; Methfessel, Sebastian ; Schmidt, L.
Author_Institution
Rohde & Schwarz GmbH & Co. KG, Munich, Germany
Volume
13
Issue
6
fYear
2012
Firstpage
26
Lastpage
43
Abstract
Due to the enormous advances made in semiconductor technology over the last few years, high integration densities with moderate costs are achievable even in the millimeter-wave (mm-wave) range and beyond, which encourage the development of imaging systems with a high number of channels. The mm-wave range lies between 30 and 300 GHz, with corresponding wavelengths between 10 and 1 mm. While imaging objects with signals of a few millimeters in wavelength, many optically opaque objects appear transparent, making mm-wave imaging attractive for a wide variety of commercial and scientific applications like nondestructive testing (NDT), material characterization, security scanning, and medical screening. The spatial resolution in lateral and range directions as well as the image dynamic range offered by an imaging system are considered the main measures of performance. With the availability of more channels combined with the powerful digital signal processing (DSP) capabilities of modern computers, the performance of mm-wave imaging systems is advancing rapidly.
Keywords
image processing; microwave imaging; advanced microwave imaging; digital signal processing capability; frequency 30 GHz to 300 GHz; material characterization; medical screening; millimeter-wave range; mm-wave imaging system; nondestructive testing; security scanning; semiconductor technology; spatial resolution; Digital signal processing; Microwave imaging; Millimeter wave technology; Optical imaging; Optical materials; Optical signal processing;
fLanguage
English
Journal_Title
Microwave Magazine, IEEE
Publisher
ieee
ISSN
1527-3342
Type
jour
DOI
10.1109/MMM.2012.2205772
Filename
6305002
Link To Document