Novel and simplified passive intermodulation distortion measurement using vector network analyzer

Author

Tiquan Sun ; Fenghui Xu ; Juan Lu ; Yong Xu ; Kun Liu

Author_Institution

Coll. of Commun. Eng., PLA Univ. of Sci. & Technol., Nanjing, China

fYear

2014

fDate

9-11 June 2014

Firstpage

1688

Lastpage

1690

Abstract

This paper presents novel and simplified test setups for passive intermodulation (PIM) distortion measurement using vector network analyzer (VNA). The proposed test setups can provide certain automation with 57% test time reduction and instruments reduction for modern microwave test industry. 3^rd-order PIM distortion measurements for a GSM1800 frequency band cavity filter were implemented using 2-port, 4-port Agilent VNA and classic spectrum analyzer, respectively. Measurements comparisons are also implemented and discussed.

Keywords

filters; intermodulation distortion; intermodulation measurement; network analysers; spectral analysers; 2-port vector network analyzer; 3rd-order PIM distortion measurements; 4-port Agilent VNA; GSM1800 frequency band cavity filter; classic spectrum analyzer; instruments reduction; modern microwave test industry; passive intermodulation distortion measurement; simplified test setups; test time reduction; Distortion measurement; Microwave amplifiers; Microwave circuits; Microwave communication; Microwave filters; Microwave measurement; Signal generators; PIM; PIM distortion measurements; VNA; passive intermodulation; vector network analyzer;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics and Applications (ICIEA), 2014 IEEE 9th Conference on

Conference_Location

Hangzhou

Print_ISBN

978-1-4799-4316-6

Type

conf

DOI

10.1109/ICIEA.2014.6931439

Filename

6931439