DocumentCode :
128692
Title :
Novel and simplified passive intermodulation distortion measurement using vector network analyzer
Author :
Tiquan Sun ; Fenghui Xu ; Juan Lu ; Yong Xu ; Kun Liu
Author_Institution :
Coll. of Commun. Eng., PLA Univ. of Sci. & Technol., Nanjing, China
fYear :
2014
fDate :
9-11 June 2014
Firstpage :
1688
Lastpage :
1690
Abstract :
This paper presents novel and simplified test setups for passive intermodulation (PIM) distortion measurement using vector network analyzer (VNA). The proposed test setups can provide certain automation with 57% test time reduction and instruments reduction for modern microwave test industry. 3rd-order PIM distortion measurements for a GSM1800 frequency band cavity filter were implemented using 2-port, 4-port Agilent VNA and classic spectrum analyzer, respectively. Measurements comparisons are also implemented and discussed.
Keywords :
filters; intermodulation distortion; intermodulation measurement; network analysers; spectral analysers; 2-port vector network analyzer; 3rd-order PIM distortion measurements; 4-port Agilent VNA; GSM1800 frequency band cavity filter; classic spectrum analyzer; instruments reduction; modern microwave test industry; passive intermodulation distortion measurement; simplified test setups; test time reduction; Distortion measurement; Microwave amplifiers; Microwave circuits; Microwave communication; Microwave filters; Microwave measurement; Signal generators; PIM; PIM distortion measurements; VNA; passive intermodulation; vector network analyzer;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2014 IEEE 9th Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4799-4316-6
Type :
conf
DOI :
10.1109/ICIEA.2014.6931439
Filename :
6931439
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=128692
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