DocumentCode :
1286981
Title :
Amplified spontaneous emission effects in semiconductor laser amplifiers
Author :
Chow, Weng W. ; Craig, Richard R.
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Volume :
26
Issue :
8
fYear :
1990
fDate :
8/1/1990 12:00:00 AM
Firstpage :
1363
Lastpage :
1368
Abstract :
The analysis presented provides a quantitative method for predicting semiconductor laser amplifier performance in the presence of ASE (amplified spontaneous emission). It indicates that in order to increase the fraction of pump power that contributes to the amplification of the input laser field relative to that spent in overcoming internal losses, an amplifier should operate at as high an excitation level as possible. This may mean operating an amplifier above its free-running oscillation threshold. A limitation to the maximum pump power is the increase in ASE. With too high an excitation, ASE dominates over the amplified input laser field, resulting in a quenching of the amplifier gain, efficiency and coherence. ASE effects may be mitigated by increasing the input laser intensity, decreasing the amplifier facet reflectivities, or, in some cases, tuning the master oscillator so that it is resonant with the amplifier. The analysis indicates that minimizing the facet reflectivity is the most effective way to circumvent ASE limitations to power scaling semiconductor laser amplifiers
Keywords :
laser theory; semiconductor junction lasers; superradiance; ASE; amplified spontaneous emission; amplifier facet reflectivities; amplifier gain; coherence; efficiency; excitation level; input laser intensity; internal losses; master oscillator tuning; power scaling; pump power; quantitative method; semiconductor laser amplifier performance; High power amplifiers; Laser excitation; Laser tuning; Performance analysis; Power lasers; Pump lasers; Reflectivity; Semiconductor lasers; Semiconductor optical amplifiers; Spontaneous emission;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/3.59683
Filename :
59683
Link To Document :
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