• DocumentCode
    1287007
  • Title

    Distributed feedback gain-coupled lasers based on InGaAs quantum-wire arrays

  • Author

    Robadey, J. ; Marti, U. ; Miles, R.O. ; Glick, Madeleine ; Filipowitz, F. ; Achtenhagen, M. ; Martin, D. ; Morier-Genoud, F. ; Silva, P.C. ; Magnenat, Y. ; Jouneau, P.-H. ; Bobard, F. ; Reinhart, F.K.

  • Author_Institution
    Inst. de Micro- et Optoelectron., Ecole Polytech. Federale de Lausanne, Switzerland
  • Volume
    9
  • Issue
    1
  • fYear
    1997
  • Firstpage
    5
  • Lastpage
    7
  • Abstract
    Fabrication and characterization of a current-injected InGaAs-GaAs quantum-wire gain-coupled distributed feedback (DFB) laser operating at 77 K at a wavelength of 923 nm are presented. Threshold current densities in broad area lasers were measured to be as low as 160 A/cm2. The side-mode suppression ratio at twice threshold is 35 dB. A 4-μm rib waveguide device has a threshold of 14 mA. The patterning process for the second-order DFB grating fabricated with deep UV holography and wet-chemical etching is described.
  • Keywords
    III-V semiconductors; current density; distributed feedback lasers; etching; gallium arsenide; holographic gratings; indium compounds; optical fabrication; quantum well lasers; rib waveguides; semiconductor laser arrays; semiconductor quantum wires; waveguide lasers; 14 mA; 4 mum; 77 K; 923 nm; InGaAs quantum-wire arrays; InGaAs-GaAs; broad area lasers; current-injected InGaAs-GaAs quantum-wire gain-coupled DFB laser; deep UV holography; distributed feedback gain-coupled lasers; fabrication; patterning process; rib waveguide device; second-order DFB grating; side-mode suppression ratio; threshold current densities; wet-chemical etching; Area measurement; Current measurement; Density measurement; Distributed feedback devices; Indium gallium arsenide; Laser feedback; Optical arrays; Optical device fabrication; Threshold current; Waveguide lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Technology Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1041-1135
  • Type

    jour

  • DOI
    10.1109/68.554152
  • Filename
    554152