Title :
Transient voltages on bonded cable sheaths
Author :
Halperin, Herman ; E. Clem, J. ; Miller, Keith
Author_Institution :
Commonwealth Edison Co., Chicago, Ill.
Abstract :
Field experience and tests show that unexpectedly high transient sheath voltages occur during the switching of charging current in single-conductor cable-type bus leads and in underground single-conductor power transmission cables bonded to eliminate sheath losses. No sheath troubles from these voltages have been found. Theoretical analysis of these voltages is presented together with suggested methods for protection of equipment, when the latter is necessary.
Journal_Title :
Electrical Engineering
DOI :
10.1109/EE.1935.6539595