DocumentCode
128757
Title
The conducted interference of electromagnetic pulse toward switch trigger system
Author
Fucun Han ; Shanhong He ; Denren Feng ; Binying Peng ; Junhua Chen
Author_Institution
Anhui Univ. of Technol., Ma´anshan, China
fYear
2014
fDate
9-11 June 2014
Firstpage
2041
Lastpage
2045
Abstract
In order to analyze the impact of the conducted interference of electromagnetic pulse´s (EMP) effects on the reliability of switch trigger system, a common-ground coupling model is established and the research on the interference of the hydrogen thyristor´s grid under the condition of common-ground coupling is taken by studying electromagnetic pulse (EMP). The results of experiments which are carried out in the condition of repetitive frequency EMP are showed to confirm that the conducted interference of electromagnetic pulse (EMP) has impact on tube output, and then both increasing quantity and reducing interval of repetitive frequency EMP can increase the probabilities of false triggering. Comparing with the theoretical analysis and the experiment results, it is concluded that this phenomenon originated from conducted interference accumulation effect of repetitive frequency and high frequency component strengthen leads to enhanced coupling.
Keywords
electromagnetic interference; electromagnetic pulse; common-ground coupling model; coupling; electromagnetic pulse interference; false triggering; frequency component; hydrogen thyristor grid; repetitive frequency EMP; switch trigger system; theoretical analysis; Couplings; Electromagnetic interference; Electron tubes; Hydrogen; Logic gates; Rectifiers; accumulation effect; conducted interference; grounding coupling; repetitive frequency EMP;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2014 IEEE 9th Conference on
Conference_Location
Hangzhou
Print_ISBN
978-1-4799-4316-6
Type
conf
DOI
10.1109/ICIEA.2014.6931505
Filename
6931505
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