• DocumentCode
    128757
  • Title

    The conducted interference of electromagnetic pulse toward switch trigger system

  • Author

    Fucun Han ; Shanhong He ; Denren Feng ; Binying Peng ; Junhua Chen

  • Author_Institution
    Anhui Univ. of Technol., Ma´anshan, China
  • fYear
    2014
  • fDate
    9-11 June 2014
  • Firstpage
    2041
  • Lastpage
    2045
  • Abstract
    In order to analyze the impact of the conducted interference of electromagnetic pulse´s (EMP) effects on the reliability of switch trigger system, a common-ground coupling model is established and the research on the interference of the hydrogen thyristor´s grid under the condition of common-ground coupling is taken by studying electromagnetic pulse (EMP). The results of experiments which are carried out in the condition of repetitive frequency EMP are showed to confirm that the conducted interference of electromagnetic pulse (EMP) has impact on tube output, and then both increasing quantity and reducing interval of repetitive frequency EMP can increase the probabilities of false triggering. Comparing with the theoretical analysis and the experiment results, it is concluded that this phenomenon originated from conducted interference accumulation effect of repetitive frequency and high frequency component strengthen leads to enhanced coupling.
  • Keywords
    electromagnetic interference; electromagnetic pulse; common-ground coupling model; coupling; electromagnetic pulse interference; false triggering; frequency component; hydrogen thyristor grid; repetitive frequency EMP; switch trigger system; theoretical analysis; Couplings; Electromagnetic interference; Electron tubes; Hydrogen; Logic gates; Rectifiers; accumulation effect; conducted interference; grounding coupling; repetitive frequency EMP;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics and Applications (ICIEA), 2014 IEEE 9th Conference on
  • Conference_Location
    Hangzhou
  • Print_ISBN
    978-1-4799-4316-6
  • Type

    conf

  • DOI
    10.1109/ICIEA.2014.6931505
  • Filename
    6931505