Title :
On the characterization of optical fiber network components with optical frequency domain reflectometry
Author :
von der Weid, J.P. ; Passy, Rogiero ; Mussi, G. ; Gisin, Nicolas
Author_Institution :
Centre for Telecommun. Studies, Pontificia Univ. Catolica do Rio de Janeiro, Brazil
fDate :
7/1/1997 12:00:00 AM
Abstract :
The basic features of coherent optical frequency domain reflectometry are presented. The ultimate limits of range and sensitivity were discussed, as well as polarization effects. It is shown that this technique is very suitable for optical network components characterization, and accurate measurements of a number of such components are presented
Keywords :
Michelson interferometers; light interferometry; optical communication equipment; optical fibre polarisation; optical fibre testing; optical time-domain reflectometry; sensitivity; accurate measurements; coherent optical frequency domain reflectometry; optical fiber network component testing; optical frequency domain reflectometry; optical network components characterization; polarization effects; sensitivity; Frequency domain analysis; Optical crosstalk; Optical devices; Optical fiber networks; Optical interferometry; Optical modulation; Optical noise; Optical reflection; Optical sensors; Reflectometry;
Journal_Title :
Lightwave Technology, Journal of
