Title :
Bulk-compensated technique and its application to subthreshold ICs
Author :
Luo, Haipeng ; Han, Yi ; Cheung, Ray C. C. ; Han, Xiaoyu ; Zhu, Dalong
Author_Institution :
Dept. of Electr. Eng., Zhejiang Univ., Hangzhou, China
Abstract :
A bulk-compensated technique to reduce process-related sensitivity in subthreshold integrated circuits (ICs) is presented. The bulk-compensated technique builds up a ´detecting-feedback´ loop, and achieves effective compensation for the process-related fluctuation of MOS transistors through bulk potential modulation, which greatly enhances the stability and robustness of subthreshold ICs. A bulk-compensated class-C inverter is implemented in 0.13 μm CMOS mixed-signal process. Compared to traditional class-C inverters, the sensitivity of the proposed inverter to process variation is greatly reduced.
Keywords :
CMOS integrated circuits; MOSFET; invertors; mixed analogue-digital integrated circuits; sensitivity analysis; CMOS mixed-signal process; MOS transistors; bulk potential modulation; bulk-compensated class-C inverter technique; feedback loop detection; process-related sensitivity reduction; size 0.13 mum; subthreshold IC; subthreshold integrated circuit;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2010.0559