Title :
Physics of electronic transport in low-dimensionality materials for future FETs
Author :
Fischetti, M.V. ; Vandenberghe, W.G. ; Fu, Binglei ; Narayanan, Shrikanth ; Kim, Jung-Ho ; Ong, Z.-Y. ; Suarez-Negreira, A. ; Sachs, C. ; Aboud, S.J.
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of Texas at Dallas, Richardson, TX, USA
Abstract :
We show that scaling rules, quantum confinement in thin bodies, and the resulting gate leakage render imperative the use of low-dimensionality materials as channels in devices scaled beyond the 10 nm gate length. We then consider a few examples of two-dimensional materials of great interest, graphene and bilayer graphene, and show how the dielectric environment (gate and interlayer insulators, nearby gates) has a dramatically strong effect on the electronic properties of systems such as supported graphene, nanoribbons, and graphene bilayers in which a Bose-Einstein exciton condensation has been predicted to occur at high temperature. Finally, we consider the novel concept of devices based on monolayer tin (`stannanane´) as a topological insulator.
Keywords :
Bose-Einstein condensation; electron transport theory; excitons; field effect transistors; graphene; Bose-Einstein exciton condensation; FET; bilayer graphene; electronic properties; electronic transport; graphene bilayers; interlayer insulators; low-dimensionality materials; nanoribbons; size 10 nm; two-dimensional materials; Dielectrics; Electron mobility; Graphene; Insulators; Logic gates; Materials; Scattering;
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-1-4799-5287-8
DOI :
10.1109/SISPAD.2014.6931548