Title :
Experimental demonstration of a low-latency fiber soliton logic gate
Author :
Ahn, Kyu H. ; Vaziri, M. ; Barnett, Brandon C. ; Williams, Guy R. ; Cao, X.D. ; Islam, Mohammed N. ; Malo, B. ; Hill, Kenneth O. ; Chowdhury, D.Q.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI, USA
fDate :
8/1/1996 12:00:00 AM
Abstract :
We experimentally demonstrate switching in a 50 m-long soliton logic gate with a switching energy of 40 pJ using 490 fs pulses at 1.553 μm from an erbium-doped fiber laser. A full characterization of this gate shows a peak contrast ratio of 4.2:1, a timing window of 1.1 pulse width and cascadable operation. To our knowledge, the gate length of 50 m is at least six times shorter than other designs with comparable switching energies. The low-latency of this gate is possible due to a low-birefringent polarization-maintaining fiber that possesses a high polarization extinction ratio of up to 20 dB with a low birefringence of 2.6×10-6. The low birefringence leads to a longer walk-off length between two orthogonally polarized pulses, where the walk-off length for 490 fs pulses is 56 m. We also study this gate numerically and find good agreement between the simulations and experiments
Keywords :
birefringence; erbium; fibre lasers; high-speed optical techniques; optical fibre communication; optical fibre polarisation; optical logic; optical solitons; optical switches; optical transmitters; 1.553 mum; 40 pJ; 490 fs; 50 m; 56 m; Er-doped fiber laser; cascadable operation; gate length; low-birefringent polarization-maintaining fiber; low-latency fiber soliton logic gate; orthogonally polarized pulses; peak contrast ratio; polarization extinction ratio; soliton logic gate; switching; switching ener; switching energies; timing window; walk-off length; Birefringence; Erbium-doped fiber amplifier; Erbium-doped fiber lasers; Frequency; Logic gates; Optical fiber devices; Optical fiber polarization; Optical fibers; Optical pulses; Solitons;
Journal_Title :
Lightwave Technology, Journal of