• DocumentCode
    1288437
  • Title

    Do chip size limits exist for DCA?

  • Author

    Schubert, Andreas ; Dudek, Rainer ; Leutenbauer, Rudolf ; Döring, Ralf ; Kloeser, Joachim ; Oppermann, H. ; Michel, Bernd ; Reichl, Herbert ; Baldwin, Daniel F. ; Qu, Jianmin ; Sitaraman, Suresh K. ; Swaminathan, Madhavan ; Wong, C.P. ; Tummala, Rao

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration, Berlin, Germany
  • Volume
    22
  • Issue
    4
  • fYear
    1999
  • fDate
    10/1/1999 12:00:00 AM
  • Firstpage
    255
  • Lastpage
    263
  • Abstract
    Solder joints, the most widely used flip chip on board (FCOB) interconnects, have a relatively low structural compliance due to the large thermal expansion mismatch between silicon die and the organic substrate. The coefficient of thermal expansion (CTE) of the printed wiring board (PWB) is almost an order of magnitude greater than that of the integrated circuit (IC). Under operating and testing conditions, this mismatch subjects the solder joints to large creep strains and leads to early failure of the solder connections. The reliability of such flip chip structures can be enhanced by applying an epoxy-based underfill between the chip and the substrate, encapsulating the solder joints. This material, once cured, mechanically couples the IC and substrate together to locally constrain the CTE mismatch. However, the effects of CTE mismatch are assumed to become more severe with increasing chip size. Even with the addition of an underfill material, it has been supposed that there are limits on the chip size used in flip chip applications
  • Keywords
    chip-on-board packaging; creep; encapsulation; flip-chip devices; integrated circuit packaging; soldering; thermal expansion; CTE mismatch; DCA; chip size limits; coefficient of thermal expansion; creep strains; epoxy-based underfill; flip chip on board; solder joints; structural compliance; thermal expansion mismatch; underfill material; Capacitive sensors; Circuit testing; Creep; Flip chip; Integrated circuit interconnections; Lead; Silicon; Soldering; Thermal expansion; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/6104.816091
  • Filename
    816091