DocumentCode :
1288560
Title :
Cavity perturbation technique for the measurement of permittivity tensor of uniaxially anisotropic dielectrics
Author :
Chen, Linfeng ; Ong, C.K. ; Tan, B.T.G.
Author_Institution :
Dept. of Phys., Nat. Univ. of Singapore, Singapore
Volume :
48
Issue :
6
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
1023
Lastpage :
1030
Abstract :
Based on microwave resonant perturbation theory, a bimodal TE112 cylindrical cavity is developed for the measurement of permittivity tensor of uniaxially anisotropic dielectrics. The two perpendicular TE112 degenerate modes in the cavity are used to measure the two complex components in the permittivity tensor of a uniaxial sample, respectively. In the measurement of each component, only the corresponding mode resonates in the bimodal cavity, and the real and imaginary parts of the complex component are deduced from the changes of the resonant frequency and the quality factor of the cavity due to sample insertion. In the present technique, the quality factors of the cavity before and after sample insertion are measured at the same frequency, so the uncertainties caused by the variation of the total stored energy in the cavity due to sample insertion are eliminated. Experimental results show that the present technique is accurate and reliable for the measurement of the permittivity tensor of uniaxial media. As an example, the dielectric properties of α-SiO2 samples with different crystal orientations are characterized using the present technique
Keywords :
cavity resonators; dielectric materials; microwave measurement; permittivity measurement; perturbation theory; silicon compounds; α-SiO2 samples; MgO; NaCl; Rexolite; SiO2; TE112 cylindrical cavity; bimodal cavity; cavity perturbation; complex components; crystal orientations; frequency retuning; measurement of permittivity tensor; microwave resonant perturbation theory; perpendicular TE112 cavity; quality factor; resonant frequency; sample insertion; uncertainties; uniaxial media; uniaxially anisotropic dielectrics; Dielectric measurements; Frequency measurement; Microwave measurements; Microwave theory and techniques; Permittivity measurement; Perturbation methods; Q factor; Resonance; Tellurium; Tensile stress;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.816108
Filename :
816108
Link To Document :
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