DocumentCode :
1288774
Title :
Dispersive comb-spectrum interferometer: metrological characterization
Author :
Minoni, Umberto ; Rovati, Luigi ; Bonardi, M. ; Docchio, Franco
Author_Institution :
Dept. of Electron. for Autom., Brescia Univ., Italy
Volume :
48
Issue :
6
fYear :
1999
fDate :
12/1/1999 12:00:00 AM
Firstpage :
1197
Lastpage :
1200
Abstract :
The paper reports results of an investigation on the main measurement uncertainty sources in a novel distance meter based on dispersive comb-spectrum interferometry. The light source is a commercial laser diode operating at 670 nm driven under the threshold condition, and emitting a beam with a comb-shaped spectrum. Sensitivity of the measurement to the operating conditions has been evaluated. Results from an experimental activity aimed at characterizing the laser and to measure the performance of a prototype implementation are also presented. The system can perform unambiguous nonincremental distance measurements over a range of 0.8 mm with a total uncertainty of about 1.5 μm
Keywords :
distance measurement; light interferometers; measurement by laser beam; measurement uncertainty; optical dispersion; 0.8 mm; 670 nm; dispersive comb-spectrum interferometer; distance meter; laser diode light source; measurement uncertainty sources; metrological characterization; nonincremental distance measurements; operating conditions; threshold condition; Charge-coupled image sensors; Diode lasers; Dispersion; Distance measurement; Frequency measurement; Laser beams; Measurement uncertainty; Optical beam splitting; Optical interferometry; Performance evaluation;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.816136
Filename :
816136
Link To Document :
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