Title :
On the assumption of mutual independence of jitter realizations in P-TRNG stochastic models
Author :
Haddad, Patrick ; Teglia, Yannick ; Bernard, F. ; Fischer, V.
Author_Institution :
Adv. Syst. Technol., STMicroelectron., Rousset, France
Abstract :
Security in true random number generation in cryptography is based on entropy per bit at the generator output. The entropy is evaluated using stochastic models. Several recent works propose stochastic models based on assumptions related to selected physical analog phenomena such as noise or jittery signal and on the knowledge of the principle of randomness extraction from the obtained analog signal. However, these assumptions simplify often considerably the underlying analog processes, which include several noise sources. In this paper, we present a new comprehensive multilevel approach, which enables to build the stochastic model based on detailed analysis of noise sources starting at transistor level and on conversion of the noise to the clock jitter exploited at the generator level. Using this approach, we can estimate proportion of the jitter coming only from the thermal noise, which is included in the total clock jitter.
Keywords :
cryptography; jitter; random number generation; stochastic processes; thermal noise; P-TRNG stochastic models; analog signal; clock jitter; comprehensive multilevel approach; cryptography; entropy per bit; generator level; jitter realizations; jittery signal; mutual independence; noise sources; physical analog phenomena; randomness extraction; thermal noise; transistor level; true random number generation; Entropy; Generators; Jitter; Noise; Stochastic processes; Thermal noise; Transistors;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
DOI :
10.7873/DATE.2014.052