DocumentCode :
1289198
Title :
Hydrodynamic equations for semiconductors with nonparabolic band structure
Author :
Thoma, Rainer ; Emunds, Axel ; Meinerzhagen, Bernd ; Peifer, Hermann-Josef ; Engl, Walter L.
Author_Institution :
Inst. fuer Theor. Elektrotech., Aachen Univ., Germany
Volume :
38
Issue :
6
fYear :
1991
fDate :
6/1/1991 12:00:00 AM
Firstpage :
1343
Lastpage :
1353
Abstract :
A system of generalized hydrodynamic equations is derived from Boltzmann´s transport equation for semiconductors without the assumption of a parabolic band structure. After some simplifications these equations can be arranged in such a way that their structure is similar to that of the well-known conventional ones. For this purpose the quantity carrier temperature is redefined and five relaxation times have to be introduced instead of the two in use so far, in order to take nonparabolicity into account. For all quantities of interest results from Monte Carlo simulation are presented for silicon with an impurity concentration of up to 1018 cm-3 and an electric field of up to 200 kV/cm. They show that two of the five relaxation times are not distinguishable; hence, for silicon at room temperature the number of relaxation times can be reduced to four. Considerable deviations from results derived under the assumption of a parabolic band structure demonstrate the necessity of this generalized hydrodynamic model. The new hydrodynamic model is applied to a n-channel LDD MOSFET with a 0.5-μm channel length. The results agree well with the results of Monte Carlo device simulation
Keywords :
Boltzmann equation; Monte Carlo methods; electrical conductivity of crystalline semiconductors and insulators; electronic conduction in crystalline semiconductor thin films; elemental semiconductors; insulated gate field effect transistors; semiconductor device models; silicon; 0.5 micron; Boltzmann´s transport equation; Monte Carlo device simulation; Monte Carlo simulation; channel length; electric field; generalized hydrodynamic equations; generalized hydrodynamic model; impurity concentration; n-channel LDD MOSFET; quantity carrier temperature; relaxation times; semiconductors; semiconductors with nonparabolic band structure; submicron MOSFETs; Electrons; Equations; Helium; Hydrodynamics; Impurities; MOSFET circuits; Monte Carlo methods; Physics; Silicon; Student members;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.81625
Filename :
81625
Link To Document :
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