DocumentCode :
128935
Title :
Interplay among Bilayer pseudoSpin field-effect transistor (BiSFET) performance, BiSFET scaling and condensate strength
Author :
Xuehao Mou ; Register, Leonard F. ; Banerjee, Sanjay K.
Author_Institution :
Dept. of ECE, Univ. of Texas at Austin, Austin, TX, USA
fYear :
2014
fDate :
9-11 Sept. 2014
Firstpage :
309
Lastpage :
312
Abstract :
It has been proposed that superfluid excitonic condensates may be possible in dielectrically separated graphene layers or other two-dimensional materials. This possibility was the basis for the proposed ultra-low power Bilayer pseudoSpin Field-effect Transistor (BiSFET). Previously, we developed an atomistic tight-binding quantum transport simulator, including the non-local exchange interaction, and used it to demonstrate the essential excitonic superfluid transport physics which underlies the proposed BiSFET in presence of such a condensate. Here we report on extension of that work to analyze dependencies on device scaling and the condensate strength of BiSFET performance and required device parameters including interlayer conductance, and critical current and voltage.
Keywords :
electric admittance; excitons; field effect transistors; low-power electronics; BiSFET; atomistic tight-binding quantum transport simulator; condensate strength; device parameters; device scaling; dielectrically separated graphene layers; excitonic superfluid transport physics; nonlocal exchange interaction; superfluid excitonic condensates; two-dimensional materials; ultra-low power bilayer pseudospin field-effect transistor; Couplings; Critical current density (superconductivity); Elementary particle exchange interactions; Excitons; Graphene; Registers; Transistors; BiSFET; Fock exchange; critical current and voltage; exciton condensate; graphene; quantum transport;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
Conference_Location :
Yokohama
ISSN :
1946-1569
Print_ISBN :
978-1-4799-5287-8
Type :
conf
DOI :
10.1109/SISPAD.2014.6931625
Filename :
6931625
Link To Document :
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