DocumentCode :
128943
Title :
Partial-SET: Write speedup of PCM main memory
Author :
Bing Li ; ShuChang Shan ; Yu Hu ; Xiaowei Li
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Inst. of Comput. Technol., Beijing, China
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
4
Abstract :
Phase change memory (PCM) is a promising nonvolatile memory technology developed as a possible DRAM replacement. Although it offers the read latency close to that of DRAM, PCM generally suffers from the long write latency. Long write request may block the read requests on the critical path of cache/memory access, incurring adverse impact on the system performance. Besides, the write performance of PCM is very asymmetric, i.e, the SET operation (writing `1´) is much slower than that of the RESET operation (writing `0´). In this work, we re-examine the resistance transform process during the SET operation of PCM and propose a novel Partial-SET scheme to alleviate the long write latency issue of PCM. During a write access to a memory line, a short Partial-SET pulse is applied first to program the PCM cells to a pre-stable state, achieving the same write latency as RESET. The partially-SET cells are then fully programmed within the retention window to preserve the data integrity. Experimental results show that our Partial-SET scheme can improve the memory access performance of PCM by more than 45% averagely with very marginal storage overhead.
Keywords :
cache storage; phase change memories; DRAM replacement; PCM main memory; RESET operation; SET operation; adverse impact; cache-memory access; data integrity; marginal storage overhead; memory line; nonvolatile memory technology; partial-SET scheme; partially-SET cells; phase change memory; read latency; read request; resistance transform process; retention window; short-partial-SET pulse; write access; write latency; write performance; write request; write speedup; Acceleration; Memory management; Phase change materials; Phase change memory; Random access memory; Reliability; Resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.066
Filename :
6800267
Link To Document :
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