Title :
Unifying self-heating and aging simulations with TMI2
Author :
Wai-Kit Lee ; Kasa Huang ; Jim Liang ; Juan-Yi Chen ; Cheng Hsiao ; Ke-Wei Su ; Chung-Kai Lin ; Min-Chie Jeng
Author_Institution :
Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
Abstract :
In this paper, we discuss how to implement the self heating and aging models with TMI. Various examples about self heating and aging simulations with TMI methodology are shown in this paper. Without trading-off the accuracy, the one with proposed TMI approach for self heating simulations takes much shorter simulation time.
Keywords :
MOSFET; ageing; semiconductor device models; FinFET; TMI methodology; TMI2; TSMC model interface; aging simulations; self heating simulations; Aging; Data models; Degradation; Heating; Integrated circuit modeling; Reliability; Temperature measurement;
Conference_Titel :
Simulation of Semiconductor Processes and Devices (SISPAD), 2014 International Conference on
Conference_Location :
Yokohama
Print_ISBN :
978-1-4799-5287-8
DOI :
10.1109/SISPAD.2014.6931631
