Title :
16-Term Error Model in Reciprocal Systems
Author :
Silvonen, Kimmo ; Dahlberg, Krista ; Kiuru, Tero
Author_Institution :
Dept. of Radio Sci. & Eng., Aalto Univ., Espoo, Finland
Abstract :
By taking reciprocity of the error network into account, full and accurate calibration of a 16-term error model can be performed using only four two-port calibration standards or termination pairs. Moreover, there is no need for a nonsymmetrical calibration standard that is strictly required in a more conventional five-standard calibration. Commercially available standard substrates can thus be used. Detailed theory of the reciprocal 16-term error model and a new calibration method are presented. Reciprocity assumption is valid in on-wafer and other measurements when two-tier calibration is applied. However, the calibration scheme allows measurement of nonreciprocal devices too. The usefulness of the new method is confirmed by practical wideband on-wafer measurements.
Keywords :
calibration; measurement errors; network analysers; 16-term error model; NWA; error network reciprocity; fíve-standard calibration; network analyzer; nonreciprocal device measurement; nonsymmetrical calibration standard; reciprocity assumption system; two-port calibration standard; wideband on-wafer measurement; Calibration; Equations; Mathematical model; Measurement uncertainty; Scattering parameters; Standards; 16-term error model; Calibration; RF device modeling; network analyzer (NWA); on-wafer measurement; scattering parameter measurement;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.2012.2217150