DocumentCode :
1289626
Title :
FX: a fast approximate fault simulator for the switch-level using VHDL
Author :
Ryan, Christopher A. ; Tront, Joseph G.
Author_Institution :
Texas Instrum. Inc., Stafford, TX, USA
Volume :
4
Issue :
3
fYear :
1996
Firstpage :
336
Lastpage :
345
Abstract :
Switch-level faults, as opposed to traditional gate-level faults, can more accurately model physical failures found in an integrated circuit. However, one problem with switch-level fault simulation is that of long simulation times. This paper addresses this problem by performing fast approximate switch-level fault simulation using transistor reverse level ordering, and a novel nine-valued switch-level extension to observability. The probability of propagation of a fault from an arbitrary line of the switch-level circuit to the primary output is shown to be a function of the average node fan-in and the line´s distance to primary output. Using this probability, results show one order of magnitude of complexity speed-up as compared to traditional fault simulation techniques, while maintaining good accuracy.
Keywords :
circuit analysis computing; fault diagnosis; hardware description languages; logic testing; observability; probability; FX; VHDL; average node fan-in; complexity speedup; fast approximate fault simulator; fault propagation; integrated circuit; nine-valued switch-level extension; observability; physical failures; probability; switch-level fault simulation; transistor reverse level ordering; Circuit faults; Circuit simulation; Integrated circuit modeling; Logic; Mathematical model; Matrix converters; Observability; Switches; Switching circuits; Voltage control;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/92.532034
Filename :
532034
Link To Document :
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