• DocumentCode
    128981
  • Title

    Fast and accurate computation using stochastic circuits

  • Author

    Alaghi, Armin ; Hayes, John P.

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Univ. of Michigan, Ann Arbor, MI, USA
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Stochastic computing (SC) is a low-cost design technique that has great promise in applications such as image processing. SC enables arithmetic operations to be performed on stochastic bit-streams using ultra-small and low-power circuitry. However, accurate computations tend to require long run-times due to the random fluctuations inherent in stochastic numbers (SNs). We present novel techniques for SN generation that lead to better accuracy/run-time trade-offs. First, we analyze a property called progressive precision (PP) which allows computational accuracy to grow systematically with run-time. Second, borrowing from Monte Carlo methods, we show that SC performance can be greatly improved by replacing the usual pseudo-random number sources by low-discrepancy (LD) sequences that are predictably progressive. Finally, we evaluate the use of LD stochastic numbers in SC, and show they can produce significantly faster and more accurate results than existing stochastic designs.
  • Keywords
    Monte Carlo methods; integrated logic circuits; low-power electronics; random number generation; stochastic processes; Monte Carlo methods; arithmetic operations; design technique; image processing; low-discrepancy sequences; low-power circuitry; progressive precision; pseudo-random number; stochastic bit-streams; stochastic circuits; stochastic computing; stochastic numbers generation; ultra-small circuitry; Accuracy; Clocks; Fluctuations; Image edge detection; Monte Carlo methods; Radiation detectors; Tin; Computer arithmetic; Monte Carlo methods; Stochastic computing; progressive precision;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.089
  • Filename
    6800290