• DocumentCode
    1290415
  • Title

    Failure mechanisms and recent improvements in ZnO arrester elements

  • Author

    Andoh, H. ; Nishiwaki, S. ; Suzuki, H. ; Boggs, S. ; Kuang, J.

  • Author_Institution
    Toshiba Corp. of Japan, Kawasaki, Japan
  • Volume
    16
  • Issue
    1
  • fYear
    2000
  • Firstpage
    25
  • Lastpage
    31
  • Abstract
    ZnO arrester elements can fail by a number of mechanisms, including electrothermal instability and thermal stress-induced mechanical cracking in this brittle ceramic. Breakdown channels at the edge of the electrode are among the most common failure mechanisms at high currents. Such failures take the form of a melt puncture of the element from the electrode edge to the opposite electrode or to the edge of the disk. This failure mechanism limits the energy absorption capability of ZnO arrester elements.
  • Keywords
    arresters; failure analysis; zinc compounds; ZnO; ZnO surge arrester element; breakdown channel; brittle ceramic; electrode edge; electrothermal instability; energy absorption; failure mechanism; mechanical cracking; melt puncture; thermal stress; Absorption; Arresters; Conducting materials; Failure analysis; Leakage current; Surges; Temperature; Thermal conductivity; Voltage; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Electrical Insulation Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    0883-7554
  • Type

    jour

  • DOI
    10.1109/57.817419
  • Filename
    817419