DocumentCode
1290415
Title
Failure mechanisms and recent improvements in ZnO arrester elements
Author
Andoh, H. ; Nishiwaki, S. ; Suzuki, H. ; Boggs, S. ; Kuang, J.
Author_Institution
Toshiba Corp. of Japan, Kawasaki, Japan
Volume
16
Issue
1
fYear
2000
Firstpage
25
Lastpage
31
Abstract
ZnO arrester elements can fail by a number of mechanisms, including electrothermal instability and thermal stress-induced mechanical cracking in this brittle ceramic. Breakdown channels at the edge of the electrode are among the most common failure mechanisms at high currents. Such failures take the form of a melt puncture of the element from the electrode edge to the opposite electrode or to the edge of the disk. This failure mechanism limits the energy absorption capability of ZnO arrester elements.
Keywords
arresters; failure analysis; zinc compounds; ZnO; ZnO surge arrester element; breakdown channel; brittle ceramic; electrode edge; electrothermal instability; energy absorption; failure mechanism; mechanical cracking; melt puncture; thermal stress; Absorption; Arresters; Conducting materials; Failure analysis; Leakage current; Surges; Temperature; Thermal conductivity; Voltage; Zinc oxide;
fLanguage
English
Journal_Title
Electrical Insulation Magazine, IEEE
Publisher
ieee
ISSN
0883-7554
Type
jour
DOI
10.1109/57.817419
Filename
817419
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