DocumentCode :
1290415
Title :
Failure mechanisms and recent improvements in ZnO arrester elements
Author :
Andoh, H. ; Nishiwaki, S. ; Suzuki, H. ; Boggs, S. ; Kuang, J.
Author_Institution :
Toshiba Corp. of Japan, Kawasaki, Japan
Volume :
16
Issue :
1
fYear :
2000
Firstpage :
25
Lastpage :
31
Abstract :
ZnO arrester elements can fail by a number of mechanisms, including electrothermal instability and thermal stress-induced mechanical cracking in this brittle ceramic. Breakdown channels at the edge of the electrode are among the most common failure mechanisms at high currents. Such failures take the form of a melt puncture of the element from the electrode edge to the opposite electrode or to the edge of the disk. This failure mechanism limits the energy absorption capability of ZnO arrester elements.
Keywords :
arresters; failure analysis; zinc compounds; ZnO; ZnO surge arrester element; breakdown channel; brittle ceramic; electrode edge; electrothermal instability; energy absorption; failure mechanism; mechanical cracking; melt puncture; thermal stress; Absorption; Arresters; Conducting materials; Failure analysis; Leakage current; Surges; Temperature; Thermal conductivity; Voltage; Zinc oxide;
fLanguage :
English
Journal_Title :
Electrical Insulation Magazine, IEEE
Publisher :
ieee
ISSN :
0883-7554
Type :
jour
DOI :
10.1109/57.817419
Filename :
817419
Link To Document :
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