DocumentCode :
1290533
Title :
Modeling and experimental verification of the interconnected mesh power system (IMPS) MCM topology
Author :
Low, Yee L. ; Schaper, Leonard W. ; Ang, Simon S.
Author_Institution :
Lucent Technologies, AT&T Bell Labs., Murray Hill, NJ, USA
Volume :
20
Issue :
1
fYear :
1997
fDate :
2/1/1997 12:00:00 AM
Firstpage :
42
Lastpage :
49
Abstract :
A new low-cost multichip module (MCM) topology, the interconnected mesh power system (IMPS), has been shown capable of reducing the metal layers of a conventional four-layer MCM by half. To provide a complete MCM on only two metal layers, the IMPS topology provides a unique and complex power distribution system and signal transmission environment. This paper reports on models of the IMPS structure based on finite-difference/partial-inductance methods and PSpice simulation. The models can easily he constructed using a commercial three-dimensional (3-D) field solver and the circuit models can be solved by PSpice. The agreement between the modeled and measured results is excellent. Discrepancies between models and results are also discussed
Keywords :
SPICE; finite difference methods; multichip modules; network topology; IMPS MCM topology; Spice simulation; circuit model; finite-difference/partial-inductance method; interconnected mesh power system; metal layer; power distribution; signal transmission; three-dimensional field solver; Circuit simulation; Circuit topology; Electromagnetic modeling; Finite difference methods; Integrated circuit interconnections; Multichip modules; Power distribution; Power system interconnection; Power system modeling; Signal design;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9894
Type :
jour
DOI :
10.1109/96.554524
Filename :
554524
Link To Document :
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