DocumentCode :
129075
Title :
Area minimization synthesis for reconfigurable single-electron transistor arrays with fabrication constraints
Author :
Yi-Hang Chen ; Jian-Yu Chen ; Juinn-Dar Huang
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
4
Abstract :
As fabrication processes exploit even deeper submicron technology, power dissipation has become a crucial issue for most electronic circuit and system designs nowadays. In particular, leakage power is becoming a dominant source of power consumption. Recently, the reconfigurable single-electron transistor (SET) array has been proposed as an emerging circuit design style for continuing Moore´s Law due to its ultra-low power consumption. Several automated synthesis approaches have been developed for the reconfigurable SET array in the past few years. Nevertheless, all of those existing methods consider fabrication constraints, which are mandatory, merely in late synthesis stages. In this paper, we propose a synthesis algorithm, featuring both variable reordering and product term reordering, for area minimization. In addition, our algorithm takes those mandatory fabrication constraints into account in early stages for better outcomes. Experimental results show that our new method can achieve an area reduction of up to 24% as compared to current state-of-the-art techniques.
Keywords :
low-power electronics; single electron transistors; Moore law; SET array; area minimization synthesis; automated synthesis approaches; circuit design style; electronic circuit; leakage power; mandatory fabrication constraints; power dissipation; product term reordering; reconfigurable single-electron transistor arrays; submicron technology; ultra-low power consumption; variable reordering; Boolean functions; Data structures; Fabrication; Minimization; Nanowires; Single electron transistors; Transistors; area minimization; automatic synthesis; binary decision diagram; reconfigurable; single-electron transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.136
Filename :
6800337
Link To Document :
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