DocumentCode :
1290939
Title :
A review on the importance of nanocomposite processing to enhance electrical insulation
Author :
Calebrese, Christopher ; Le Hui ; Schadler, Linda S. ; Nelson, J. Keith
Author_Institution :
Rensselaer Polytech. Inst., Troy, NY, USA
Volume :
18
Issue :
4
fYear :
2011
fDate :
8/1/2011 12:00:00 AM
Firstpage :
938
Lastpage :
945
Abstract :
Study of the experimental literature regarding nanodielectrics indicates numerous inconsistencies in the results obtained. In many cases, the likely cause is due to a lack of quality control during nanocomposite processing. By examining examples from the literature along with an alumina/polyamideimide nanocomposite and silica/crosslinked polyethylene nanocomposite, this contribution seeks to shed light on some of the likely causes for these inconsistencies. Measurements of the dielectric breakdown strength and voltage endurance confirm that poor dispersion can lead to poor material performance and the use of quantitative techniques is highlighted. Good dispersion alone is not sufficient to achieve improved properties. The addition of nanoparticles can alter the resulting structure of the nanocomposites, can introduce water into the system resulting in cavity formation and can also result in degradation of the polymer if the processing parameters are not carefully selected. In this review, understanding the effects of nanoparticle addition requires not only characterization of relevant dielectric properties, but also careful control of the processing parameters and characterization of changes in polymer structure, particle dispersion, and water content.
Keywords :
alumina; electric breakdown; nanocomposites; nanoparticles; permittivity; polyethylene insulation; quality control; silicon; water; Al2O3; SiO2; alumina-polyamideimide nanocomposite; dielectric breakdown strength; electrical insulation; nanodielectrics; nanoparticles; particle dispersion; polymer structure; quality control; silica-crosslinked polyethylene nanocomposite; voltage endurance; water; Dispersion; Electric breakdown; Indexes; Nanoparticles; Polymers; Scanning electron microscopy; Silicon compounds; Nanotechnology; dielectric breakdown; nonhomogenous media; plastics;
fLanguage :
English
Journal_Title :
Dielectrics and Electrical Insulation, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9878
Type :
jour
DOI :
10.1109/TDEI.2011.5976079
Filename :
5976079
Link To Document :
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