DocumentCode :
129103
Title :
Modeling steep slope devices: From circuits to architectures
Author :
Swaminathan, Karthik ; Moon Seok Kim ; Chandramoorthy, Nandhini ; Sedighi, Behnam ; Perricone, R. ; Sampson, Jack ; Narayanan, Vijaykrishnan
Author_Institution :
Pennsylvania State Univ., University Park, PA, USA
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
Steep Slope devices, with Heterojunction Tunnel FETs (TFETs) in particular, have been proposed as a viable solution to overcome the subthreshold slope limitation in existing CMOS technology and achieve ultra-low voltage operation with acceptable performance. However, state-of-the-art FinFET technologies continue to demonstrate superior performance than steep slope devices in application domains demanding peak single threaded performance. In this context, we examine different computing paradigms where TFET technologies can be used, not just as a `drop in´ replacement, but as an additional parameter to augment the architectural design space. This greatly widens the scope of optimizations for performance and power. We investigate the tradeoffs between device and architectures in general purpose processors when performance, power and temperature are individually constrained. We also synthesize examples of domain-specific accelerators used in computer vision using in-house TFET standard cell libraries to demonstrate the energy benefits of designing TFET-based accelerators. We demonstrate that synthesizing these accelerators using TFETs reduces energy by over 6X in comparison to an equivalent iso-voltage CMOS-based design and by over 30% in comparison to an iso-performance CMOS design.
Keywords :
CMOS integrated circuits; MOSFET; computer vision; low-power electronics; semiconductor device models; semiconductor heterojunctions; tunnel transistors; CMOS technology; FinFET technologies; TFET standard cell libraries; TFET technologies; TFET-based accelerators; architectural design space; computer vision; domain-specific accelerators; drop in replacement; general purpose processors; heterojunction TFETs; heterojunction tunnel FETs; isoperformance CMOS design; peak single threaded performance; steep slope device modeling; subthreshold slope limitation; ultra-low voltage operation; CMOS integrated circuits; Libraries; Microprocessors; Multicore processing; Performance evaluation; Program processors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.149
Filename :
6800350
Link To Document :
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