• DocumentCode
    1291092
  • Title

    Field and laboratory tests of insulator flashovers under conditions of light ice accumulation and contamination

  • Author

    Su, Huafeng ; Jia, Zhidong ; Sun, Zhenting ; Guan, Zhicheng ; Li, Licheng

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Shenzhen, China
  • Volume
    19
  • Issue
    5
  • fYear
    2012
  • fDate
    10/1/2012 12:00:00 AM
  • Firstpage
    1681
  • Lastpage
    1689
  • Abstract
    Investigations have been made of the performance of composite insulators because of the repeated flashover accidents on the lightly iced insulators in winter in the north of China. Based on the field research, a new test method was developed by taking into account the combined influences of the light ice accumulation and the secondary contamination deposition on the ice surface, and a different view of reproducing the atmospheric and environmental conditions in laboratory was provided accordingly. The test results confirmed that the icing flashover voltages of composite insulators with secondary contamination deposition were considerably lower than the contamination flashover voltage when the insulators were both precontaminated with the same equivalent salt deposit density (ESDD). In these areas where similar accidents happened, the increase in the insulation strength should be considered.
  • Keywords
    composite insulators; flashover; ice; insulator contamination; insulator testing; ESDD; composite insulators; contamination flashover voltage; equivalent salt deposit density; field tests; ice surface; insulator contamination; insulator flashover test; laboratory tests; light ice accumulation; lightly iced insulators; secondary contamination deposition; Conductivity; Contamination; Flashover; Ice; Insulators; Rain; Water pollution; Light ice accumulation; composite insulators; icing flashover; pre-contamination; secondary contamination; wetcontamination deposition;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/TDEI.2012.6311516
  • Filename
    6311516