DocumentCode
1291279
Title
A Methodology for Combined Modeling of Skin, Proximity, Edge, and Surface Roughness Effects
Author
Curran, Brian ; Ndip, Ivan ; Guttowski, Stephan ; Reichl, Herbert
Author_Institution
Fraunhofer Inst. for Reliability & Microintegration (IZM), Berlin, Germany
Volume
58
Issue
9
fYear
2010
Firstpage
2448
Lastpage
2455
Abstract
A methodology is introduced for modeling resistive losses in planar transmission lines that support the transverse electromagnetic mode. The methodology aims to accurately and systematically account for these losses by modeling the skin, proximity, edge, and surface roughness effects in a combined way. The results show a correlation with three measurements within 5%, and offer insight into the different sources of resistive losses at high frequencies. Considering a printed coplanar line as an example, approximately 8% of the resistive loss come from surface roughness, and 30% from the edge effects at 60 GHz. However, for a line with a higher conductivity metallization, this increases to 38% and 30%, respectively, from surface roughness and edge effects at only 20 GHz.
Keywords
coplanar waveguides; losses; skin effect; strip lines; surface roughness; transmission line theory; edge effect; frequency 20 GHz; frequency 60 GHz; planar transmission lines; printed coplanar line; proximity effect; resistive losses; skin effect; surface roughness effect; transverse electromagnetic mode; Adaptation model; Analytical models; Conductors; Electromagnetic measurements; Electromagnetic modeling; Frequency measurement; Loss measurement; Planar transmission lines; Power transmission lines; Propagation losses; Rough surfaces; Skin; Surface roughness; Transmission line measurements; Conductor modeling; edge effects; surface roughness; transmission line;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2010.2058271
Filename
5545455
Link To Document