• DocumentCode
    1291279
  • Title

    A Methodology for Combined Modeling of Skin, Proximity, Edge, and Surface Roughness Effects

  • Author

    Curran, Brian ; Ndip, Ivan ; Guttowski, Stephan ; Reichl, Herbert

  • Author_Institution
    Fraunhofer Inst. for Reliability & Microintegration (IZM), Berlin, Germany
  • Volume
    58
  • Issue
    9
  • fYear
    2010
  • Firstpage
    2448
  • Lastpage
    2455
  • Abstract
    A methodology is introduced for modeling resistive losses in planar transmission lines that support the transverse electromagnetic mode. The methodology aims to accurately and systematically account for these losses by modeling the skin, proximity, edge, and surface roughness effects in a combined way. The results show a correlation with three measurements within 5%, and offer insight into the different sources of resistive losses at high frequencies. Considering a printed coplanar line as an example, approximately 8% of the resistive loss come from surface roughness, and 30% from the edge effects at 60 GHz. However, for a line with a higher conductivity metallization, this increases to 38% and 30%, respectively, from surface roughness and edge effects at only 20 GHz.
  • Keywords
    coplanar waveguides; losses; skin effect; strip lines; surface roughness; transmission line theory; edge effect; frequency 20 GHz; frequency 60 GHz; planar transmission lines; printed coplanar line; proximity effect; resistive losses; skin effect; surface roughness effect; transverse electromagnetic mode; Adaptation model; Analytical models; Conductors; Electromagnetic measurements; Electromagnetic modeling; Frequency measurement; Loss measurement; Planar transmission lines; Power transmission lines; Propagation losses; Rough surfaces; Skin; Surface roughness; Transmission line measurements; Conductor modeling; edge effects; surface roughness; transmission line;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2010.2058271
  • Filename
    5545455