• DocumentCode
    129164
  • Title

    Cross layer resiliency in real world

  • Author

    Chandra, Vikas ; Mitra, Subhasish ; Chandra, Vikas ; Cher, Chen-Yong ; Mueller, Silvia Melitta

  • Author_Institution
    ARM US
  • fYear
    2014
  • fDate
    24-28 March 2014
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Resilience at different design hierarchies will be needed in Complex SoCs to handle failures due to variability, reliability and design errors (logical or electrical). The main reasons for the marginal behavior are sheer design complexity, uncertainties in manufacturing processes, temporal variability and operating conditions. In this session, we will cover the basics of cross layer resiliency and explore the reliability challenges in both embedded processors as well as large scale computing resources.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
  • Conference_Location
    Dresden
  • Type

    conf

  • DOI
    10.7873/DATE.2014.180
  • Filename
    6800381
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=129164