DocumentCode :
129167
Title :
Hybrid memory architecture for voltage scaling in ultra-low power multi-core biomedical processors
Author :
Bortolotti, Daniele ; Bartolini, Andrea ; Weis, Christian ; Rossi, Davide ; Beninio, Luca
Author_Institution :
DEI, Univ. of Bologna, Bologna, Italy
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
Technology scaling enables today the design of sensor-based ultra-low cost chips well suited for emerging applications such as wireless body sensor networks, urban life and environment monitoring. Energy consumption is the key limiting factor of this up-coming revolution and memories are often the energy bottleneck mainly due to leakage power. This paper proposes an ultra-low power multi-core architecture targeting eHealth monitoring systems, where applications involve collection of sequences of slow biomedical signals and highly parallel computations at very low voltage. We propose a hybrid memory architecture that combines 6T-SRAM and 8T-SRAM operating in the same voltage domain and capable of dispatching at high voltage a normal operation and at low voltage a fully reliable small memory partition (8T) while the rest of the memory (6T) is state-retentive. Our architecture offers significant energy savings with a low area overhead in typical eHealth Compressed Sensing-based applications.
Keywords :
SRAM chips; biomedical electronics; body sensor networks; compressed sensing; medical signal processing; multiprocessing systems; patient monitoring; power aware computing; 6T-SRAM; 8T-SRAM; eHealth compressed sensing-based applications; eHealth monitoring systems; energy consumption; environment monitoring; hybrid memory architecture; leakage power; sensor-based ultralow cost chips; slow biomedical signals; small memory partition; technology scaling; ultralow power multicore architecture; ultralow power multicore biomedical processors; urban life monitoring; voltage scaling; wireless body sensor networks; Electrocardiography; Hybrid power systems; Kernel; Memory architecture; Memory management; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.182
Filename :
6800383
Link To Document :
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