• DocumentCode
    1291763
  • Title

    Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers

  • Author

    Sen, Shreyas ; Devarakond, Shyam ; Chatterjee, Abhijit

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    20
  • Issue
    9
  • fYear
    2012
  • Firstpage
    1602
  • Lastpage
    1614
  • Abstract
    This work develops a simple, practical yet easily realizable method for low cost measurement of phase and amplitude distortions in radio frequency power amplifiers (RF PA). Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortions are two significant distortion effects in PAs at high output power levels, causing out of band interference in the transmitted signal and bit errors in the received signal. Traditional measurements of amplitude and phase distortion in RF PAs require the use of expensive vector network analyzers. In this work, we propose the use of phase-to-amplitude conversion to develop a low cost and accurate test methodology for AM-AM and AM-PM measurement using simple load board test circuitry along with software based difference generation and peak detection mechanisms. Using either simple sine wave stimulus with power sweep or a single amplitude modulated RF stimulus, both distortion effects can be measured with high accuracy for nominal devices as well as over process and voltage variations, while allowing significant reduction in test cost.
  • Keywords
    distortion measurement; linearisation techniques; power amplifiers; radiofrequency amplifiers; AM-AM effects; AM-PM effects; Amplitude-to-amplitude distortion; RF power amplifiers; amplitude conversion; amplitude distortions; amplitude-to-phase distortion; load board test circuitry; low cost measurement; peak detection mechanism; radio frequency power amplifier; software based difference generation; transmitted signal; Distortion measurement; Gain; Gain measurement; Phase distortion; Phase measurement; Power measurement; Radio frequency; Amplitude distortion; RF power amplifiers (RF PAs); amplitude-to-amplitude modulation (AM-AM); amplitude-to-phase modulation (AM-PM); bit error rate (BER); load board testing; low-cost measurement; phase distortion; vector network analyzer (VNA);
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2011.2160376
  • Filename
    5976427