DocumentCode
1291763
Title
Phase Distortion to Amplitude Conversion-Based Low-Cost Measurement of AM-AM and AM-PM Effects in RF Power Amplifiers
Author
Sen, Shreyas ; Devarakond, Shyam ; Chatterjee, Abhijit
Author_Institution
Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Volume
20
Issue
9
fYear
2012
Firstpage
1602
Lastpage
1614
Abstract
This work develops a simple, practical yet easily realizable method for low cost measurement of phase and amplitude distortions in radio frequency power amplifiers (RF PA). Amplitude-to-amplitude (AM-AM) and amplitude-to-phase (AM-PM) distortions are two significant distortion effects in PAs at high output power levels, causing out of band interference in the transmitted signal and bit errors in the received signal. Traditional measurements of amplitude and phase distortion in RF PAs require the use of expensive vector network analyzers. In this work, we propose the use of phase-to-amplitude conversion to develop a low cost and accurate test methodology for AM-AM and AM-PM measurement using simple load board test circuitry along with software based difference generation and peak detection mechanisms. Using either simple sine wave stimulus with power sweep or a single amplitude modulated RF stimulus, both distortion effects can be measured with high accuracy for nominal devices as well as over process and voltage variations, while allowing significant reduction in test cost.
Keywords
distortion measurement; linearisation techniques; power amplifiers; radiofrequency amplifiers; AM-AM effects; AM-PM effects; Amplitude-to-amplitude distortion; RF power amplifiers; amplitude conversion; amplitude distortions; amplitude-to-phase distortion; load board test circuitry; low cost measurement; peak detection mechanism; radio frequency power amplifier; software based difference generation; transmitted signal; Distortion measurement; Gain; Gain measurement; Phase distortion; Phase measurement; Power measurement; Radio frequency; Amplitude distortion; RF power amplifiers (RF PAs); amplitude-to-amplitude modulation (AM-AM); amplitude-to-phase modulation (AM-PM); bit error rate (BER); load board testing; low-cost measurement; phase distortion; vector network analyzer (VNA);
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2011.2160376
Filename
5976427
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