DocumentCode :
1291768
Title :
A Low Cost Calibrated DAC for High-Resolution Video Display System
Author :
Shen, Meng-Hung ; Huang, Po-Chiun
Author_Institution :
Dept. of Electr. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
Volume :
20
Issue :
9
fYear :
2012
Firstpage :
1743
Lastpage :
1747
Abstract :
This paper presents a digitally enhanced strategy for current-steering digital-to-analog converters (DACs) applied to video systems. The linearity error introduced by the wittingly small current sources is evaluated by an on-chip built-in self-test scheme, which comprises a shared CalDAC, a BiasDAC, and a digital controller. Two current tuning loops are involved for error detection and compensation. Detection range of the current deviation is expanded by utilizing the differential structure and digital signal processor (DSP). For a 12-bit DAC prototype realized in 90-nm CMOS process, about 80% gate area reduction of current source array is achieved compared with the case relying on intrinsic matching only. Measurement results demonstrate that the calibrated converter achieves fully 12-bit linearity with both DNL and INL less than 0.5 LSB. At 400-MS/s update rate, the spurious-free dynamic range is 59 dB within 30 MHz bandwidth.
Keywords :
CMOS digital integrated circuits; built-in self test; constant current sources; digital control; digital signal processing chips; digital-analogue conversion; display instrumentation; error compensation; error detection; signal resolution; tuning; video signal processing; BiasDAC; CMOS process; CalDAC; DNL; DSP; INL; calibrated converter; current deviation; current source array; current sources; current tuning loops; current-steering digital-to-analog converters; differential structure; digital controller; digital signal processor; digitally enhanced strategy; error compensation; error detection; high-resolution video display system; intrinsic matching; linearity error; low cost calibrated DAC prototype; on-chip built-in self-test scheme; spurious-free dynamic range; video systems; Built-in self-test; Calibration; Digital-analog conversion; High-resolution imaging; Tuning; Calibration; digital-to-analog convertors (DACs); low-area;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2011.2161679
Filename :
5976428
Link To Document :
بازگشت