DocumentCode
1291987
Title
Electrical Recovery After Laser-Assisted Discharge for Highly Repetitive Plasma EUV Source
Author
Lu, Peng ; Katsuki, Sunao ; Watanebe, T. ; Akiyama, Hidenori
Author_Institution
Grad. Sch. of Sci. & Technol., Kumamoto Univ., Kumamoto, Japan
Volume
39
Issue
9
fYear
2011
Firstpage
1849
Lastpage
1854
Abstract
Extreme ultraviolet (EUV) light source is still the key issue for the industrial application of EUV lithography. For the discharge-produced-plasma EUV source, highly repetitive discharge up to tens of kilohertz is required to achieve the sufficient average radiation power at intermediate focus. Electrical recovery of electrode gaps prior to each discharge influences the EUV emission and determines the repetition rate of the discharge. In this paper, electrical recovery after the main discharge is studied for the laser-assisted-discharge (LAD) tin plasma EUV source through the measurement of the electrical breakdown. The electrical recovery process lasts for a few tens to several hundreds of microseconds, and recovery time is proportional to the discharge shot energy. The measured time-varying hold-off and breakdown voltages can provide a basis for the choice of discharge voltage and corresponding maximum repetition rate. Electrical recovery was explained on the basis of dynamic variation of tin discharge products. It suggests that electrical recovery mainly depends on the diffusion of the tin vapor and its density decaying. Tin droplets do not affect the electrical recovery significantly. Larger discharge energy generates denser tin vapor and causes slower electrical recovery process, which limits the maximum repetition rate of the EUV source. In the LAD EUV source, the relative small shot energy is proper for the high-repetition-rate operation.
Keywords
discharges (electric); plasma density; plasma diagnostics; plasma light propagation; plasma sources; plasma transport processes; tin; ultraviolet lithography; ultraviolet sources; EUV lithography; breakdown voltage; diffusion; discharge shot energy; electrical recovery process; electrode gap; laser-assisted discharge; radiation power; repetition rate; repetitive plasma EUV light source; time-varying hold-off voltage; Discharges; Electrodes; Fault location; Tin; Voltage measurement; Electrical recovery; Mie scattering; high-repetition-rate extreme ultraviolet (EUV) source; laser-assisted discharge (LAD); laser-induced fluorescence (LIF);
fLanguage
English
Journal_Title
Plasma Science, IEEE Transactions on
Publisher
ieee
ISSN
0093-3813
Type
jour
DOI
10.1109/TPS.2011.2162004
Filename
5976465
Link To Document