Title :
First-order sensitivity analysis of quartz crystal resonator model parameters
Author :
Malocha, Donald C. ; Belkerdid, Madjid A.
Author_Institution :
Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL, USA
Abstract :
A first-order measurement sensitivity analysis of a single mode, quartz resonator device model was conducted. This analysis predicts the variations in the motional arm resistance versus the resonance S-parameter as a function of measurement errors. The accuracy of this first-order sensitivity analysis is verified by computer simulation and experimentally. The model parameters were extracted following the recommended EIA-512 standard. The theoretical first-order sensitivity analysis, the computer simulation results, and the experimental measurements are found to be in good agreement.<>
Keywords :
S-parameters; crystal resonators; digital simulation; electronic engineering computing; equivalent circuits; measurement errors; sensitivity analysis; EIA-512 standard; SiO/sub 2/; computer simulation; first-order measurement sensitivity analysis; measurement errors; motional arm resistance; quartz crystal resonator model parameters; resonance S-parameter; single mode quartz resonator device model; Electric resistance; Electric variables measurement; Electrical resistance measurement; Impedance; Measurement errors; Motion analysis; Parasitic capacitance; Resonance; Scattering parameters; Sensitivity analysis;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
