Title :
Voltage island management in near threshold manycore architectures to mitigate dark silicon
Author :
Silvano, Cristina ; Palermo, Gianluca ; Xydis, S. ; Stamelakos, Ioannis
Author_Institution :
Dipt. di Elettron., Inf. e Bioingegneria, Politec. di Milano, Milan, Italy
Abstract :
The power-wall problem driven by the stagnation of supply voltages in deep-submicron technology nodes, is now the major scaling barrier for moving towards the manycore era. Although the technology scaling enables extreme volumes of computational power, power budget violations will permit only a limited portion to be actually exploited, leading to the so called dark silicon. Near-Threshold voltage Computing (NTC) has emerged as a promising approach to overcome the manycore power-wall, at the expenses of reduced performance values and higher sensitivity to process variations. Given that several application domains operate over specific performance constraints, the performance sustainability is considered a major issue for the wide adoption of NTC. Thus, in this paper, we investigate how performance guarantees can be ensured when moving towards NTC manycores through variability-aware voltage and frequency allocation schemes. We propose three aggressive NTC voltage tuning and allocation strategies, showing that STC performance can be efficiently sustained or even optimized at the NTC regime. Finally, we show that NTC highly depends on the underlying workload characteristics, delivering average power gains of 65% for thread-parallel workloads and up to 90% for process-parallel workloads, while offering an extensive analysis on the effects of different voltage tuning/allocation strategies and voltage regulator configurations.
Keywords :
multiprocessing systems; power aware computing; voltage regulators; NTC voltage tuning strategies; STC performance; dark silicon; deep-submicron technology nodes; frequency allocation schemes; manycore era; manycore power-wall; near threshold manycore architectures; near-threshold voltage computing; power budget violations; power-wall problem; process-parallel workloads; supply voltage stagnation; technology scaling; thread-parallel workloads; underlying workload characteristics; variability-aware voltage allocation schemes; voltage island management; voltage regulator configurations; Clocks; Computer architecture; Radio spectrum management; Regulators; Tiles; Tuning; Voltage control;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
DOI :
10.7873/DATE.2014.214