• DocumentCode
    1292324
  • Title

    Influence of Band-Gap Opening on Ballistic Electron Transport in Bilayer Graphene and Graphene Nanoribbon FETs

  • Author

    Sako, R. ; Tsuchiya, Hideaki ; Ogawa, Michiko

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Kobe Univ., Kobe, Japan
  • Volume
    58
  • Issue
    10
  • fYear
    2011
  • Firstpage
    3300
  • Lastpage
    3306
  • Abstract
    Although a graphene is a zero-gap semiconductor, band-gap energy values up to several hundred millielectronvolts have been introduced by utilizing quantum-mechanical confinement in nanoribbon structures or symmetry breaking between two carbon layers in bilayer graphenes (BLGs). However, the opening of a band gap causes a significant reduction in carrier velocity due to the modulation of band structures in their low-energy spectra. In this paper, we study intrinsic effects of the band-gap opening on ballistic electron transport in graphene nanoribbons (GNRs) and BLGs based on a computational approach, and discuss the ultimate device performances of FETs with those semiconducting graphene channels. We have shown that an increase in the external electric field in BLG-FETs to obtain a larger band-gap energy degrades substantially its electrical characteristics because of deacceleration of electrons due to a Mexican hat structure; therefore, GNR-FETs outperform in principle BLG-FETs.
  • Keywords
    ballistic transport; energy gap; field effect transistors; graphene; nanostructured materials; C; Mexican hat structure; ballistic electron transport; band gap opening; bilayer graphene FET; computational approach; deacceleration; electrical characteristics; graphene nanoribbon FET; intrinsic effects; ultimate device performances; Dispersion; Effective mass; FETs; Logic gates; Photonic band gap; Quantum capacitance; Ballistic transport; band-gap opening; bilayer graphene (BLGs); field-effect transistors (FET); graphene nanoribbons (GNRs); mexican hat structure;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2161992
  • Filename
    5977018