DocumentCode :
1292416
Title :
The challenge of reliability
Author :
Strube, Arthur R.
Volume :
1
Issue :
3
fYear :
1985
fDate :
5/1/1985 12:00:00 AM
Firstpage :
40
Lastpage :
45
Abstract :
The question is considered of whether the reliability of technology can be improved a fast enough rate to meet system needs. A brief historical survey of computer advances demonstrates the important role that reliability has played. Special attention is given to the advances in reliability made possible by the transistor. It is emphasized that new applications followed from advances in reliability. The author believes that `full availability´ can be obtained from present technologies with the use of redundancy in both memory and logic.
Keywords :
history; redundancy; reliability; full availability; historical survey; redundancy; reliability; system needs; Availability; Computers; Integrated circuit reliability; Semiconductor device reliability; Software; Transistors;
fLanguage :
English
Journal_Title :
Circuits and Devices Magazine, IEEE
Publisher :
ieee
ISSN :
8755-3996
Type :
jour
DOI :
10.1109/MCD.1985.6311969
Filename :
6311969
Link To Document :
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