Title :
The experimental and theoretical characterization of the SAW propagation properties for zinc oxide films on silicon carbide
Author :
Didenko, Irina S. ; Hickernell, Fred S. ; Naumenko, Natalya F.
Author_Institution :
Crystal Phys. Dept., Moscow Steel & Alloys Inst., Moscow, Russia
Abstract :
The surface acoustic wave (SAW) propagation properties of zinc oxide (ZnO) films on silicon carbide (SiC) have been theoretically and experimentally characterized in the film thickness-to-acoustic wavelength ratio range up to 0.12. The experimental characterization of the SAW propagation properties was performed with a linear array of interdigital transducer (IDT) structures. The measurements characterized the velocity and propagation loss of two surface modes, a generalized SAW (GSAW) mode with velocities between 6000 and 7000 m/s, and a high velocity Pseudo-SAW (HVPSAW) mode with velocities between 8500 and 12 500 m/s. The experimentally determined characteristics of the two waves have been compared with the results of calculations based on published data for SiC and ZnO. Simulation of wave characteristics was performed with various values of the elastic constant C/sub 13/, which is absent in the published set of material constants for SiC, within the interval permitted by the requirement of positive elastic energy in a hexagonal crystal. The best agreement between the measured and calculated propagation losses of the HVPSAW has been obtained for C/sub 13/ near zero. Although for the GSAW mode the calculated velocity dispersion has been found nearly insensitive to the value of C/sub 13/ and consistent with the experimental data, for the HVPSAW, some disagreement between measured and calculated velocities, which increased with ZnO film thickness, has been observed for any C/sub 13/ value. Theoretical analysis of HVPSAW has revealed the existence of a previously unknown high velocity SAW (HVSAW). The displacement components of this wave have been analyzed as functions of depth and confirmed its pure surface, one-partial character.
Keywords :
II-VI semiconductors; elastic constants; piezoelectric semiconductors; piezoelectric thin films; semiconductor thin films; silicon compounds; surface acoustic waves; ultrasonic velocity; wide band gap semiconductors; zinc compounds; 6000 to 12500 m/s; SAW propagation; SiC; ZnO; elastic constant; hexagonal crystal; high velocity SAW; high velocity pseudo-SAW mode; positive elastic energy; propagation loss; silicon carbide; surface acoustic wave; surface modes; velocity; velocity dispersion; zinc oxide films; Acoustic propagation; Acoustic transducers; Acoustic waves; Loss measurement; Propagation losses; Semiconductor films; Silicon carbide; Surface acoustic waves; Velocity measurement; Zinc oxide;
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on