Title :
Ultra-low power electronics with Si/Ge tunnel FET
Author :
Trivedi, Amit Ranjan ; Amir, Mohammad Faisal ; Mukhopadhyay, Saibal
Author_Institution :
Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
Si/Ge Tunnel FET (TFET) with its subthermal subthreshold swing is attractive for low power analog and digital designs. Greater Ion/Ioff ratio of TFET can reduce the dynamic power in digital designs, while higher gm/IDS can lower the bias power of analog amplifier. However, the above benefits of TFET are eclipsed by MOSFET at a higher power/performance point. Ultra low power scalability of the key analog and digital circuits, SRAM and operational transconductance amplifier (OTA), with TFET is demonstrated. Analyzing a TFET based cellular neural network, this work shows the feasibility of ultra-low-power neuromorphic computing with TFET.
Keywords :
Ge-Si alloys; MOSFET; SRAM chips; cellular neural nets; low-power electronics; operational amplifiers; semiconductor device reliability; MOSFET; OTA; SRAM; Si-Ge; TFET based cellular neural network; analog amplifier; analog circuits; analog designs; bias power; digital circuits; digital designs; dynamic power; neuromorphic computing; operational transconductance amplifier; performance point; power point; subthermal subthreshold swing; tunnel FET; ultra-low power electronics; Computer architecture; FinFETs; Microprocessors; Random access memory; Silicon; Transconductance; Cellular neural network; Low power design; Operational transconductance amplifier; SRAM; Tunnel FET;
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
DOI :
10.7873/DATE.2014.244