A new global finite element analysis of microwave circuits including lumped elements

Author

Guillouard, Karine ; Wong, Man-Faï ; Hanna, Victor Fouad ; Citerne, J.

Author_Institution

CNET, Issy-les-Moulineaux, France

Volume

44

Issue

12

fYear

1996

fDate

12/1/1996 12:00:00 AM

Firstpage

2587

Lastpage

2594

Abstract

A new fullwave global analysis of complex inhomogeneous microwave structures including passive or active, linear or nonlinear lumped elements is presented. For a given structure, only one electromagnetic simulation of the distributed part, by a three-dimensional (3-D) finite element method using edge elements, is needed corresponding to the insertion of variable lumped elements placed at the same position. Simulation results of various test cases, containing either resistor, diode, or active component, are compared with those provided by a commercial circuit analysis software or with measurements results. Our validated electromagnetic simulator is then used for analyzing a planar balanced mixer operating in the millimetric range

Keywords

finite element analysis; linear network analysis; microwave circuits; nonlinear network analysis; 3D finite element method; EM simulator; edge elements; electromagnetic simulation; fullwave global analysis; global finite element analysis; lumped elements; microwave circuits; planar balanced mixer; three-dimensional FEM; Analytical models; Circuit analysis; Circuit simulation; Circuit testing; Diodes; Finite element methods; Microwave circuits; Resistors; Software measurement; Software testing;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.554608

Filename

554608