DocumentCode :
129298
Title :
Reconfigurable silicon nanowire devices and circuits: Opportunities and challenges
Author :
Weber, Walter M. ; Trommer, Jens ; Grube, Matthias ; Heinzig, Andre ; Konig, Markus ; Mikolajick, Thomas
Author_Institution :
NaMLab gGmbH, Dresden, Germany
fYear :
2014
fDate :
24-28 March 2014
Firstpage :
1
Lastpage :
6
Abstract :
Reconfigurable fine-grain electronics target an increase in the number of integrated logic functions per chip by enhancing the functionality at the device level and by implementing a compact and technologically simple hardware platform. Here we study a promising realization approach by employing reconfigurable nanowire transistors (RFETs) as the multifunctional building-blocks to be integrated therein. RFETs merge the electrical characteristics of unipolar n- and p- type FETs into a single universal device. The switch comprises four terminals, where three of them act as the conventional FET electrodes and the fourth acts as an electric select signal to dynamically program the desired switch type. The transistor consists of two independent charge carrier injection valves as represented by two gated Schottky junctions integrated within an intrinsic silicon nanowire. Radial compressive strain applied to the channel is used as a scalable method to adjust n- and p-FET currents to each other, thereby enabling complementary logic circuits. Simple but relevant examples for the reconfiguration of complete gates will be given, demonstrating the potential of this technology.
Keywords :
Schottky barriers; compressive strength; elemental semiconductors; field effect transistors; logic circuits; nanoelectronics; nanowires; silicon; FET electrodes; RFET; Schottky junctions; charge carrier injection valves; complementary logic circuits; hardware platform; integrated logic functions; radial compressive strain; reconfigurable fine grain electronics; reconfigurable nanowire transistors; reconfigurable silicon nanowire devices; unipolar n-type FET; unipolar p-type FET; Charge carriers; Field effect transistors; Junctions; Logic gates; Nanoscale devices; Silicon; Tunneling; RFET; Reconfigurable transistor; Schottky FET; doping free CMOS; inverter; nanowire; reconfigurable circuit; symmetric FET; universal transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Automation and Test in Europe Conference and Exhibition (DATE), 2014
Conference_Location :
Dresden
Type :
conf
DOI :
10.7873/DATE.2014.249
Filename :
6800450
Link To Document :
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