Title :
Analog ALC crystal oscillators for high-temperature applications
Author :
Bianchi, Raül Andrés ; Karam, Jean Michel ; Courtois, Bernard
Author_Institution :
TIMA Lab., Grenoble, France
Abstract :
Fundamental mode and third-harmonic mode integrated high-performance automatic level controlled (ALC) crystal oscillators for high-temperature applications (up to 250/spl deg/C), are described in this paper. These oscillators were designed for a pressure measurement system in high-temperature environments, where the output signal is the difference between both generated frequencies. Frequency variations smaller than 0.0001 ppm/s for each oscillator and a frequency drift of about 2.5 ppm/year of the frequency difference are the measured performance concerning, respectively, the short-term (1 s) and long-term frequency stability of these integrated high performance crystal oscillators over the 30/spl deg/C-225/spl deg/C temperature range. Other important characteristics are the very stable and constant oscillation levels (/spl sim/1.1 Vpp), the small second-harmonic distortion (/spl sim/60 dR), and the phase noise (/spl sim/95 dB at 50 kHz shift). The characteristics of these oscillators make them also suitable for many other measurement systems (time, temperature, and other physical and chemical quantities), especially if they are constrained to operate under severe temperature conditions.
Keywords :
crystal oscillators; frequency stability; harmonic distortion; high-temperature electronics; phase noise; 30 to 250 degC; analog ALC crystal oscillators; automatic level control; constant oscillation levels; frequency drift; frequency stability; fundamental mode; high-temperature applications; measurement systems; phase noise; pressure measurement system; second-harmonic distortion; severe temperature conditions; third-harmonic mode; Automatic control; Automatic logic units; Distortion measurement; Frequency measurement; Oscillators; Pressure measurement; Signal design; Signal generators; Stability; Temperature measurement;
Journal_Title :
Solid-State Circuits, IEEE Journal of