Title :
Preparation of (K, Na)NbO3-CaTiO3 film by RF magnetron sputtering
Author :
Ikeuchi, Shinji ; Yoneda, Tomokazu ; Matsuki, Y. ; Endo, N. ; Takeshima, Yutaka ; Horiuchi, Hiroyasu ; Kishimoto, Yutaka ; Yamamoto, Koji ; Fujimoto, Kenji
Author_Institution :
Murata Manuf. Co., Ltd., Kyoto, Japan
Abstract :
Lead-free piezoelectric (K, Na)NbO3-CaTiO3 (KNN-CT) films were prepared on Pt/Ti/SiO2/Si substrates by RF magnetron sputtering. Co-sputtering using a number of KNN-CT targets which vary in compositions of Na/(K+Na) ratio and amount of CaTiO3 provided variations in compositions of KNN-CT films. The obtained KNN-CT films had compositions corresponding to the average compositions of the used targets represented by chemical formula of (1-n)(K1-x, Nax)NbO3-nCaTiO3 (x=0.460-0.617, n=0.000-0.065) and the compositional dependencies of their piezoelectric properties were studied. Most KNN-CT films with n>0.000 exhibited relatively high transverse piezoelectric coefficients |e31 *|=|d31|/s11,p>6.0C/m2 (where s11,p is elastic compliance of the KNN-CT films), whereas n=0.000 |e31 *|<;5.0C/m2. In XRD analysis, (002) peak angle of these pseudocubic perovskite films increased with increase of n. From these results, we conclude that CaTiO3 was successfully substituted as part of KNN and piezoelectric constant increased by effect of CaTiO3. In addition, the KNN-CT films with x=0.587-0.617 and n=0.027-0.053 exhibited higher |e31 *| than any other x and n. Moreover, by 750°C post-annealing process, |e31 *| of the KNN-CT film with x=0.587 and n=0.040 was enhanced and the highest |e31 *|=11.7C/m2 was confirmed. This result of our experiment shows one of highest piezoelectric coefficient for lead free piezoelectric films.
Keywords :
annealing; piezoelectric thin films; potassium compounds; sodium compounds; sputtering; (K, Na)NbO3-CaTiO3 film preparation; KNN-CT; KNbO3-CaTiO3; NaNbO3-CaTiO3; Pt-Ti-SiO2-Si; Pt/Ti/SiO2/Si substrates; RF magnetron sputtering; chemical formula; cosputtering; lead-free piezoelectric films; piezoelectric properties; postannealing process; pseudocubic perovskite films; transverse piezoelectric coefficients; Ceramics; Electrodes; Films; Lead; Niobium; Sputtering; Substrates; lead free; piezoelectric film; sputtering;
Conference_Titel :
Ultrasonics Symposium (IUS), 2014 IEEE International
Conference_Location :
Chicago, IL
DOI :
10.1109/ULTSYM.2014.0391