Title :
LSI logic testing — An overview
Author :
Muehldorf, Eugen I. ; Savkar, Anil D.
Author_Institution :
TRW Inc., McLean, VA, USA
Abstract :
The development of large scale integration (LSI) testing is reviewed. The paper concentrates on the testing of logic components and presents in-depth discussions of the methods of fault modeling, test pattern generation, fault simulation, and design for testability. It is shown how these methods are used in the design of components and how they can be used in support of design automation. Finally, a brief account of test equipment and test data preparation is given.
Keywords :
integrated circuit testing; logic design; logic testing; Boolean difference; D algorithm; design automation; fault modeling; fault simulation; large scale integration; path sensitisation; test data preparation; test equipment; test pattern generation; testability; testing of logic; Biological system modeling; Circuit faults; Integrated circuit modeling; Large scale integration; Logic gates; Test pattern generators; Boolean difference; D-algorithm; LSI testing; design for testability; fault modeling; fault simulation; path sensitization; test pattern generation;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.6312152
