DocumentCode :
1293372
Title :
Multiple reactions in inductors
Author :
Cavicchi, Thomas J.
Author_Institution :
Dept. of Electr. Eng., Grove City Coll., PA, USA
Volume :
40
Issue :
1
fYear :
1997
fDate :
2/1/1997 12:00:00 AM
Firstpage :
78
Lastpage :
88
Abstract :
In this paper, the importance of the high-order nested (recursive) reactions that can take place in lossy inductors is investigated. The inquisitive student may ask, “What about the Faraday/Lenz reaction to the `first´ Faraday/Lenz reaction?”-a matter about which textbooks are generally silent. It is shown here that the sinusoidal steady-state results for the current in a lossy inductor normally obtained by solving differential equations or performing phasor calculations can be reproduced exactly using Faraday´s/Lenz´s laws recursively, to infinite order. Thus no knowledge of differential equations nor of phasors is required to find the current, and the result practically demonstrates the connection between Faraday´s/Lenz laws and circuit analysis. The case of a single sinusoid is analyzed, which by Fourier´s theorem and linear superposition can in principle be generalized to any excitation. Moreover, the dynamic equations developed can be used directly for any excitation without appeal to Fourier decomposition. A typical nonsinusoidal initial-value problem, involving both transient and driving-function components, is solved as a further demonstration of the technique
Keywords :
differential equations; electrical engineering education; inductors; initial value problems; losses; Fourier´s theorem; differential equations; driving-function component; electrical engineering student; high-order nested reactions; high-order recursive reactions; linear superposition; lossy inductors; nonsinusoidal initial-value problem; phasor calculations; single sinusoid; sinusoidal steady-state results; transient component; Circuit analysis; Cities and towns; Coils; Differential equations; Education; Electromagnetic forces; Electromagnetic transients; Inductors; Magnetic field measurement; Voltage;
fLanguage :
English
Journal_Title :
Education, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9359
Type :
jour
DOI :
10.1109/13.554672
Filename :
554672
Link To Document :
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