Title :
A fault diagnosis algorithm for asymmetric modular architectures
Author :
Meyer, Gerard G. L.
Author_Institution :
Dept. of Electrical Engng., Johns Hopkins Univ., Baltimore, MD, USA
Abstract :
Pertains to the analysis of an algorithm for the automatic fault diagnosis of asymmetric modular networks.
Keywords :
fault location; logic testing; asymmetric modular architectures; asymmetric modular networks; fault diagnosis algorithm; Algorithm design and analysis; Circuit faults; Computer architecture; Fault diagnosis; Logic gates; Partitioning algorithms; Testing; Connection assignment; diagnosis algorithm; modular architecture; permanent fault; syndrome;
Journal_Title :
Computers, IEEE Transactions on
DOI :
10.1109/TC.1981.6312161
