Title :
Fault-tolerant serial-parallel multiplier
Author :
Chen, L.G. ; Chen, T.-H.
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fDate :
7/1/1991 12:00:00 AM
Abstract :
The paper presents a fault-tolerant circuit design using a time-redundancy method for a serial-parallel multiplier, which is useful in DSP applications with serial data transmission. It utilises the (RECO recomputing with circularly shifted operands) technique to detect errors concurrently. A simple OR-gate based circuit is used as the location table to identify faulty bit-slice pairs. The reconfiguration technique is then introduced to bypass the potential faulty bit-slices. This design can have the maximum detectable error region ( equivalent to n/2 bits), without appending extra computing elements. The latency from error detection to location is only about two clock cycles, i.e. almost real-time detecting can be achieved. Pipe-lined timing for two computations is illustrated. The analyses of performance and complexity are described. The results that this is an efficient design methodology for fault-tolerant multiplication with serial data.
Keywords :
VLSI; fault tolerant computing; multiplying circuits; redundancy; DSP applications; OR-gate based circuit; RECO; complexity; concurrent error detection; detectable error region; error detection; fault-tolerant circuit design; faulty bit-slice pairs; location table; performance; reconfiguration technique; serial-parallel multiplier; time-redundancy method;
Journal_Title :
Computers and Digital Techniques, IEE Proceedings E