DocumentCode :
1293758
Title :
Via coupling within parallel rectangular planes
Author :
Parker, James C., Jr.
Author_Institution :
Sun Microsyst., Mountain View, CA, USA
Volume :
39
Issue :
1
fYear :
1997
fDate :
2/1/1997 12:00:00 AM
Firstpage :
17
Lastpage :
23
Abstract :
Convenient formulas which characterize via or probe coupling are presented for both frequency-domain mutual impedance and time-domain voltage waveforms. These expressions are valid for arbitrary via locations and take into account all edge reflections. Skin effect is included within the frequency domain formulas. These results have application to power/ground plane “bounce” in digital circuits. They also provide insight into more general transient behavior. A direct closed-form Fourier inversion back into the time domain is detailed for the negligible loss case. To determine the behavior for finite rise-time excitations, the step response is integrated term-by-term to obtain a ramp response. Responses of other excitations, such as a finite rise-time step current, and various pulse currents, are easily obtained through superposition of appropriately delayed ramp responses. This process is extended to include piecewise-quadratic current excitation waveforms, thereby avoiding all slope discontinuities. These somewhat more involved expressions give “smoother” results which may have greater esthetic appeal
Keywords :
digital circuits; electric impedance; electric potential; electromagnetic wave reflection; frequency-domain analysis; piecewise-linear techniques; probes; skin effect; time-domain analysis; transmission line theory; delayed ramp responses; digital circuits; direct closed-form Fourier inversion; discontinuities; edge reflections; finite rise-time excitations; finite rise-time step current; frequency domain formulas; frequency-domain mutual impedance waveform; parallel plate transmission lines; parallel rectangular planes; piecewise-quadratic current excitation waveforms; power/ground plane bounce; probe coupling; pulse currents; ramp response; skin effect; step response; time-domain voltage waveform; transient behavior; via coupling; Coupling circuits; Digital circuits; Frequency domain analysis; Impedance; Mutual coupling; Probes; Reflection; Skin effect; Time domain analysis; Voltage;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9375
Type :
jour
DOI :
10.1109/15.554691
Filename :
554691
Link To Document :
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