DocumentCode
1293777
Title
Resonant tunnelling in Ga0.47In0.53As/InP double-barrier structures grown by AP-MOCVD
Author
Higgs, A.W. ; Taylor, L.L. ; Apsley, N.
Author_Institution
R. Signals & Radar Establ., Great Malvern
Volume
24
Issue
6
fYear
1988
fDate
3/17/1988 12:00:00 AM
Firstpage
322
Lastpage
323
Abstract
Reports the first observation of negative-differential resistance in Ga0.47In0.53As/InP double-barrier structures grown by AP-MOCVD. The devices exhibit the largest peak/valley current ratios seen in this system; 1.2:1 (2.8:1) and 3.0:1 (5.5:1) at 77 K (4.2 K) for the n =1 and n =2 resonances respectively
Keywords
chemical vapour deposition; gallium arsenide; indium compounds; negative resistance; semiconductor junctions; tunnelling; 4.2 K; 77 K; AP-MOCVD; double-barrier structures; negative-differential resistance; peak/valley current ratios; resonant tunnelling;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
Filename
8191
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